Materials Analysis: Solutions for the Manufacturing Industry
Shortcuts for efficient root cause analysis
GCM Lab invites you to the second edition of the event Materials Analysis: Solutions for the Manufacturing Industry (MASI2010) ; Shortcuts for efficient root cause analysis. Following the success of last year's event, we keep the winning formula of conferences given by knowledgeable members of the GCM as well as from industry leaders, with a particular focus on the manufacturing industry this year. This event is for all companies interested in knowing how they can improve their productivity and yield by using materials analysis to solve the most demanding industrial problems such as contaminations, process failures or quality issues. The emphasis will be put on methods and tools that allow for efficient and quick root cause analysis.
Experts in materials analysis, coming from both academia and industry, will present concrete examples of materials characterization techniques. In addition, you will have the opportunity to interact with other industry people to discuss best practises in materials analysis. Laboratory tours will complete the day.
The event will take place at École Polytechnique on Tuesday November 2nd, 2010.
What previous participants had to say about MASI:
« Thank you for organizing MASI2009. The event was well structured and the topics discussed were varied and pertinent.”
- Alexandre Simard, Rolls Royce
“Congratulations for everything. Great occasion for me to be at AMSI 2009 to get updated and learn about GCM capabilities”
- Victor Necula, Patt Technologies
“Very nice initiative”
- participant from an aerospace company
MASI2010 program, 2 November 2010
| 8:30 | Registration | |
| 9:00 | Welcoming Notes | |
| 9:05 | Overview of Modern Materials Analysis Techniques
Alain Rochefort, professor, GCM, École Polytechnique
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| 10:00 | Materials Analysis at Bombardier Aerospace
Martin Lamy, Bombardier Aerospace
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| 10:40 |
Break
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| 11:00 | Surface Contaminant Analysis
Suzie Poulin, research associate, GCM Lab
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| 11:30 | Failure Analysis in Manufacturing Problem Solving : Application in micro-electronics Stéphane Laforte, IBM Canada |
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| 11:50 |
Lunch
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| 1:00 |
Development and Characterization of New Polymer Materials
Christian Filion, Lavergne Group |
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| 1:30 |
Neutron Activation Analysis for Quality Control and Product Development in Canadian Industries
Cornelia Chilian, École Polytechnique |
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| 2:00 | SR&ED eligibility in industrial context
Alexandre Deneault, KPMG
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| 2:20 | Break | |
| 2:40 |
Raman and FTIR Spectroscopy in Industry
Michel Lafleur, full professor, Université de Montréal |
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| 3:10 | Laboratory tour | |
| 4:15 | Cocktail |
The registration cost is 90$ per person (lunch, coffee break and cocktail included), payable by credit card.
To register now, click here.
To register now, click here.
For additional information, please contact Jean-Sébastien Tassé:
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, 514-340-4711 #7458.