Description

Atomic Force Microscopy is an imaging technique that is widely used due to its high resolution and the large array of materials it can analyse (dielectrics, conductors, biological materials, etc). A mechanical probe scans the sample surface while the vertical displacement is controlled, in general, by optical techniques. The vertical displacement is caused by the attraction forces between the sample surface and the probe tip. Not only does the AFM map the sample surface, it can also measure roughness and give qualitative information on the viscoelasticity of heterogeneous surfaces. AFM applications include examining a semiconductor wafer or evaluating the impact of surface roughness on the adhesion properties of a material.

Uses Surface imaging 3D topography Roughness measurement

Technical specifications

Depth resolution :	0.01 nm
Lateral resolution :	0.1 nm
Other characteristics :	Imaging, liquid and electrochemical cells
Manufacturer :	Digital Instruments
Models :	Multimode, Dimension 3100 (2x), Enviroscope
Manufacturer :	Topometrix
Models :	Discoverer
Manufacturer :	Autoprobe CP
Models :	Thermo Microscope