A contamination, even at very low concentration, can severely hamper an industrial process. Therefore, it is essential to be able to identify contaminants accurately and quickly whenever they appear. GCM Lab facilities can detect and measure traces of impurities, as low as parts per billion (ppb). GCM Lab experts have developed many analytical techniques for organic and inorganic compounds, including precipitates, coatings and powders. We have the expertise required to solve your toughest contamination challenges.

Analytical techniques

The choice of a technique relies on a number of factors like the type of contaminant, the expected level or the dimension of the surface to be analyzed. The GCM uses mainly the following methods for contaminant analysis:

• Scanning Electron Microscopy (SEM)
• Auger Electron Spectroscopy (AES)
• Fourier Transform Infrared Spectroscopy (FTIR)
• Time-of-flight Secondary Ion Mass Spectroscopy (TOF-SIMS)
• X-Ray Photoelectron Spectroscopy (XPS)
• X-Ray Diffraction (XRD)