Description

EBSD is a scanning electron microscopy technique that is used to determine the crystalline orientation at any point on the surface of a sample. This enables one to characterize the texture, the grain size, the nature and distribution of phases, the grain joints as well as the deformations and stresses. EBSD can be applied to a large range of materials including steel, ceramic composites, thin films and mineralogical samples.

Uses

• Determiner the texture
• Determiner the grain size 
• Identify phases and their distribution
• Characterize deformations and stresses 

Technical specifications

Depth resolution :	30 nm
Lateral resolution :	up to 10 nm or better
Detector :	Nordlys II, 12 bit, 1344x1024 pixels, adjustable sampling angle
EBSD software:	CHANNEL de HKL Technology
Other characteristics :	ultra high vacuum, in situ heating
Manufacturer :	Omicron Nanotechnology
Model :	NanoSAM (camera and software from HKL Technology)