Modern microscopes (optical, electronic and atomic force) provide high resolution images of a sample surface. The Scanning Electron Microscope is the preferred instrument for many imaging applications due to its excellent resolution. When a sample is cut with a Focused Ion Beam (FIB), the SEM gives in addition images of the depth of the material. Microscopic imaging techniques also provide information on the phases present at the surface, the viscosity or the hardness. The competent staff of GCM Lab and the CM2 have expertise in the microscopic analysis of many types of samples such as metals, electronic materials, ceramics, etc. We carry out our measurements with modern equipment offering resolution in the nm range.
Analytical techniques
