The GCM is proud to announce the acquisition of a new surface profiler from Veeco, the Dektak 150+. This high resolution apparatus serves to analyze the topography and roughness of surfaces. It can also measure stress in thin films. Offering great repeatability, the Dektak 150+ can profile horizontal variations up to 1 mm. This instrument is very useful to characterize thin films deposited on substrates. By constantly adding new equipment to its facilities, the GCM confirms its position as a leader in research and services in advanced materials in Canada.

Contact
Jean-Sébastien Tassé
Coordinator of industrial projects
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514-340-4711 #7458