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Description
The profilometer is a high accuracy instrument used for topographical and surface roughness measurements. A stylus gently scans the surface, while the vertical movement is monitored continuously. Veeco Dektak 150 profilometer offers a high vertical resolution of a few angstroms, with a maximum vertical displacement of 1 mm. It is perfect for analyzing surfaces with steep hills and deep holes.
Uses
- Surface topography in 2D and 3D
- Roughness measurement
- Stress measurement in thin films (profile prior to deposition is necessary)
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