29 April 2010, École Polytechnique, Montréal, Canada
Course Objectives
- Understand the basic principle of operation of an atomic force microscope
- Distinguish between the different imaging modes (contact, non-contact, intermittent contact, frictional force, phase contrast, etc.)
- Consider the practical aspects of AFM imaging (choice of scanning probe, sample preparation, recognition of imaging artefacts, etc.)
- Discover different applications of AFM in materials science
Course contents
This course aims to provide the participants with a good understanding of the uses, strengths and limitations of atomic force microscopy for the analysis of surface topography and materials properties. The emphasis is on the basic principles and practical aspects of AFM imaging.
The course begins with an overview of the evolution of AFM in the last 30 years. The basic principles of AFM are then presented, including the tip-sample interaction force, hardware components, imaging and data acquisition systems.
Applications of AFM are then addressed: nm-scale characterization of surface topography, 3D mapping of large areas, surface roughness analysis, etc. Tips are also given on the operation of an AFM such as the proper electronic settings for a given sample and medium, tip choice, scanning speed, sample preparation, etc.
Who should attend?
Chemists, physicists, scientists, technicians, and engineers who want to learn about the practical aspects of AFM.
Instructor:
Antonella Badia, Associate Professor, Université de Montréal
Registration fees:
425$ through April 2nd, 495$ after April 2nd
Lunch is included in the registration fee.
Schedule
April 29, 2010
9:00 to 12:00 and 1:00 to 3:00 : short course
3:00 to 4:30: demonstration of AFM.
Additional information
Jean-Sébastien Tassé
514-340-4711 #7458
Cette adresse email est protégée contre les robots des spammeurs, vous devez activer Javascript pour la voir.