Description
XPS, also known as Electron Spectroscopy for Chemical Analysis (ESCA), gives the elemental composition, the electronic and chemical state of elements found in the first 1 to 10 nm from the sample surface. This ultra high vacuum technique measures the photoelectrons emitted from the sample after it has been irradiated by magnesium or aluminum x-rays, as described by Einstein’s photoelectric effect.
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Uses
- Quantitative and non destructive surface analysis of organic and inorganic materials
- Identification of the chemical species present
- Contaminant identification
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Technical specifications
| Elements detected : |
Lithium - uranium |
| Resolution / sensitivity : |
0.1 – 1 at% |
| Depth resolution : |
1 – 10 nm |
| Lateral resolution : |
250 µm – 2 mm |
| Other characteristics : |
Mapping, depth profiling, T = -196 – 600 °C, Preparation and deposition chamber |
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| Manufacturer : |
VG Scientific |
| Model : |
ESCALAB 3 MKII |
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| Manufacturer : |
Kratos |
| Model : |
Axis Ultra |
